/dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.19-amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SSD 1TB Serial Number: -- Firmware Version: X0104A0 User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available Device is: Not in smartctl database 7.3/5528 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Mar 24 01:14:49 2025 HKT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SCT capabilities: (0x0001) SCT Status supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0 9 Power_On_Hours -O--CK 100 100 050 - 1 12 Power_Cycle_Count -O--CK 100 100 050 - 15 160 Unknown_Attribute -O--CK 100 100 050 - 0 161 Unknown_Attribute PO--CK 100 100 050 - 100 163 Unknown_Attribute -O--CK 100 100 050 - 18 164 Unknown_Attribute -O--CK 100 100 050 - 205 165 Unknown_Attribute -O--CK 100 100 050 - 1 166 Unknown_Attribute -O--CK 100 100 050 - 0 167 Unknown_Attribute -O--CK 100 100 050 - 0 168 Unknown_Attribute -O--CK 100 100 050 - 5050 169 Unknown_Attribute -O--CK 100 100 050 - 100 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0 177 Wear_Leveling_Count -O--CK 100 100 050 - 0 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 050 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0 192 Power-Off_Retract_Count -O--CK 100 100 050 - 15 194 Temperature_Celsius -O---K 100 100 050 - 40 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0 196 Reallocated_Event_Count -O--CK 100 100 050 - 0 197 Current_Pending_Sector -O--CK 100 100 050 - 0 198 Offline_Uncorrectable -O--CK 100 100 050 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0 232 Available_Reservd_Space -O--CK 100 100 050 - 100 241 Total_LBAs_Written ----CK 100 100 050 - 1118 242 Total_LBAs_Read ----CK 100 100 050 - 141 245 Unknown_Attribute -O--CK 100 100 050 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Status Version: 3 SCT Version (vendor specific): 0 (0x0000) Device State: Active (0) Current Temperature: 40 Celsius Power Cycle Min/Max Temperature: 40/40 Celsius Lifetime Min/Max Temperature: 40/43 Celsius Specified Max Operating Temperature: 100 Celsius Under/Over Temperature Limit Count: 0/0 SCT Data Table command not supported SCT Error Recovery Control command not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 15 --- Lifetime Power-On Resets 0x01 0x010 4 1 --- Power-on Hours 0x01 0x018 6 73284515 --- Logical Sectors Written 0x01 0x020 6 302905 --- Number of Write Commands 0x01 0x028 6 9300411 --- Logical Sectors Read 0x01 0x030 6 127738 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 16 Device-to-host register FISes sent due to a COMRESET /dev/sdb smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.19-amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: HDSSOSB-256GB Serial Number: -- Firmware Version: SBFM61.3 User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available Device is: Not in smartctl database 7.3/5528 ATA Version is: ACS-4 (minor revision not indicated) SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Mar 24 01:14:49 2025 HKT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (65535) seconds. Offline data collection capabilities: (0x79) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. Conveyance self-test routine recommended polling time: ( 6) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 0 9 Power_On_Hours -O--C- 100 100 000 - 698 12 Power_Cycle_Count -O--C- 100 100 000 - 199 168 Unknown_Attribute -O--C- 100 100 000 - 0 170 Unknown_Attribute PO---- 100 100 010 - 84 173 Unknown_Attribute -O--C- 100 100 000 - 524307 192 Power-Off_Retract_Count -O--C- 100 100 000 - 91 194 Temperature_Celsius PO---K 067 067 000 - 33 (Min/Max 33/33) 218 Unknown_Attribute PO-R-- 100 100 050 - 0 231 Unknown_SSD_Attribute PO--C- 100 100 000 - 99 241 Total_LBAs_Written -O--C- 100 100 000 - 1276 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 64 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (64 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 199 --- Lifetime Power-On Resets 0x01 0x010 4 698 --- Power-on Hours 0x01 0x018 6 2677883444 --- Logical Sectors Written 0x01 0x028 6 2524986176 --- Logical Sectors Read 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 33 --- Current Temperature 0x05 0x020 1 33 --- Highest Temperature 0x05 0x028 1 33 --- Lowest Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 360 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 4 16 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 17 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC