Probe #c994b59712 of Toshiba Satellite A505

Log: smartctl

/dev/sda smartctl 7.2 2020-12-30 r5155 [x86_64-linux-6.8.0-59-generic] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Indilinx Barefoot_2/Everest/Martini based SSDs Device Model: OCZ-AGILITY4 Serial Number: -- LU WWN Device Id: 5 e83a97 ... Firmware Version: 1.5.2 User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Fri May 23 15:27:46 2025 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Unavailable Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x1d) SMART execute Offline immediate. No Auto Offline data collection support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x00) Error logging NOT supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 0) minutes. Extended self-test routine recommended polling time: ( 0) minutes. SMART Attributes Data Structure revision number: 18 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate ------ 006 000 000 - 6 3 Spin_Up_Time ------ 100 100 000 - 0 4 Start_Stop_Count ------ 100 100 000 - 0 5 Reallocated_Sector_Ct ------ 100 100 000 - 0 9 Power_On_Hours ------ 100 100 000 - 7037 12 Power_Cycle_Count ------ 100 100 000 - 1265 232 Lifetime_Writes ------ 100 100 000 - 20161635645 233 Media_Wearout_Indicator ------ 100 000 000 - 100 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 0 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 SL R/O 1 NCQ Command Error log 0xa0 SL VS 255 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log (GP Log 0x07) not supported Warning! SMART Self-Test Log Structure error: invalid SMART checksum. SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported


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