Probe #c227966510 of ASUSTek FX503VM

Log: smartctl

/dev/nvme0n1 smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.16.19-76051619-generic] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: WDC WDS100T2B0C-00PXH0 Serial Number: -- Firmware Version: 211210WD PCI Vendor/Subsystem ID: 0x15b7 IEEE OUI Identifier: 0x001b44 Total NVM Capacity: 1,000,204,886,016 [1.00 TB] Unallocated NVM Capacity: 0 Controller ID: 1 NVMe Version: 1.4 Number of Namespaces: 1 Namespace 1 Size/Capacity: 1,000,204,886,016 [1.00 TB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 001b44 ... Local Time is: Wed Apr 27 20:53:18 2022 BST Firmware Updates (0x14): 2 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Log Page Attributes (0x1e): Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Pers_Ev_Lg Maximum Data Transfer Size: 128 Pages Warning Comp. Temp. Threshold: 80 Celsius Critical Comp. Temp. Threshold: 85 Celsius Namespace 1 Features (0x02): NA_Fields Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 3.50W 2.90W - 0 0 0 0 0 0 1 + 2.70W 1.80W - 0 0 0 0 0 0 2 + 1.90W 1.50W - 0 0 0 0 0 0 3 - 0.0250W - - 3 3 3 3 3900 11000 4 - 0.0050W - - 4 4 4 4 5000 39000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 2 1 - 4096 0 1 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 39 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 0% Data Units Read: 8,878,592 [4.54 TB] Data Units Written: 10,602,778 [5.42 TB] Host Read Commands: 100,486,062 Host Write Commands: 189,681,480 Controller Busy Time: 395 Power Cycles: 508 Power On Hours: 4,092 Unsafe Shutdowns: 6 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Error Information (NVMe Log 0x01, 16 of 256 entries) No Errors Logged /dev/sda smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.16.19-76051619-generic] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SanDisk SDSSDH3 1T00 Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: 401100RL User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Apr 27 20:53:18 2022 BST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 4 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 --- - 0 9 Power_On_Hours -O--CK 100 100 --- - 6119 12 Power_Cycle_Count -O--CK 100 100 --- - 1386 165 Unknown_Attribute -O--CK 100 100 --- - 8519782 166 Unknown_Attribute -O--CK 100 100 --- - 1 167 Unknown_Attribute -O--CK 100 100 --- - 66 168 Unknown_Attribute -O--CK 100 100 --- - 3 169 Unknown_Attribute -O--CK 100 100 --- - 582 170 Unknown_Attribute -O--CK 100 100 --- - 0 171 Unknown_Attribute -O--CK 100 100 --- - 0 172 Unknown_Attribute -O--CK 100 100 --- - 0 173 Unknown_Attribute -O--CK 100 100 --- - 2 174 Unknown_Attribute -O--CK 100 100 --- - 4 184 End-to-End_Error -O--CK 100 100 --- - 0 187 Reported_Uncorrect -O--CK 100 100 --- - 0 188 Command_Timeout -O--CK 100 100 --- - 0 194 Temperature_Celsius -O---K 077 053 --- - 23 (Min/Max 11/53) 199 UDMA_CRC_Error_Count -O--CK 100 100 --- - 0 230 Unknown_SSD_Attribute -O--CK 001 001 --- - 85900656660 232 Available_Reservd_Space PO--CK 100 100 004 - 100 233 Media_Wearout_Indicator -O--CK 100 100 --- - 2112 234 Unknown_Attribute -O--CK 100 100 --- - 2449 241 Total_LBAs_Written ----CK 253 253 --- - 2297 242 Total_LBAs_Read ----CK 253 253 --- - 2775 244 Unknown_Attribute -O--CK 000 100 --- - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 2261 Current Device Internal Status Data log 0x25 GPL R/O 2261 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 1386 --- Lifetime Power-On Resets 0x01 0x010 4 6119 --- Power-on Hours 0x01 0x018 6 4817948052 --- Logical Sectors Written 0x01 0x020 6 15274235 --- Number of Write Commands 0x01 0x028 6 5821449965 --- Logical Sectors Read 0x01 0x030 6 850436438604 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 27 Device-to-host register FISes sent due to a COMRESET


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