/dev/nvme0n1 smartctl 7.2 2020-12-30 r5155 [x86_64-linux-6.2.0-36-generic] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: SAMSUNG MZALQ512HALU-000L2 Serial Number: -- Firmware Version: 3L1QFXV7 PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Total NVM Capacity: 512,110,190,592 [512 GB] Unallocated NVM Capacity: 0 Controller ID: 5 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 512,110,190,592 [512 GB] Namespace 1 Utilization: 295,821,320,192 [295 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 ... Local Time is: Wed Nov 15 10:49:38 2023 CET Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Log Page Attributes (0x0f): S/H_per_NS Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Maximum Data Transfer Size: 512 Pages Warning Comp. Temp. Threshold: 82 Celsius Critical Comp. Temp. Threshold: 85 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 4.83W - - 0 0 0 0 0 0 1 + 3.54W - - 1 1 1 1 0 0 2 + 3.04W - - 2 2 2 2 0 500 3 - 0.0500W - - 3 3 3 3 210 1200 4 - 0.0050W - - 4 4 4 4 1000 9000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 16 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 3% Data Units Read: 32,016,538 [16.3 TB] Data Units Written: 26,007,960 [13.3 TB] Host Read Commands: 428,042,984 Host Write Commands: 395,757,403 Controller Busy Time: 2,495 Power Cycles: 2,535 Power On Hours: 1,093 Unsafe Shutdowns: 31 Media and Data Integrity Errors: 0 Error Information Log Entries: 7,432 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 16 Celsius Error Information (NVMe Log 0x01, 16 of 64 entries) Num ErrCount SQId CmdId Status PELoc LBA NSID VS 0 7432 0 0x0018 0x4004 - 0 0 - /dev/sda smartctl 7.2 2020-12-30 r5155 [x86_64-linux-6.2.0-36-generic] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Marvell based SanDisk SSDs Device Model: SanDisk SDSSDA-1T00 Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: 411040RL User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 15 10:49:38 2023 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 4 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 --- - 0 9 Power_On_Hours -O--CK 100 100 --- - 5433 12 Power_Cycle_Count -O--CK 100 100 --- - 2764 165 Total_Write/Erase_Count -O--CK 100 100 --- - 41157106 166 Min_W/E_Cycle -O--CK 100 100 --- - 2 167 Min_Bad_Block/Die -O--CK 100 100 --- - 97 168 Maximum_Erase_Cycle -O--CK 100 100 --- - 13 169 Total_Bad_Block -O--CK 100 100 --- - 834 170 Unknown_Marvell_Attr -O--CK 100 100 --- - 0 171 Program_Fail_Count -O--CK 100 100 --- - 0 172 Erase_Fail_Count -O--CK 100 100 --- - 0 173 Avg_Write/Erase_Count -O--CK 100 100 --- - 7 174 Unexpect_Power_Loss_Ct -O--CK 100 100 --- - 1 184 End-to-End_Error -O--CK 100 100 --- - 0 187 Reported_Uncorrect -O--CK 100 100 --- - 0 188 Command_Timeout -O--CK 100 100 --- - 0 194 Temperature_Celsius -O---K 069 055 --- - 31 (Min/Max 4/55) 199 SATA_CRC_Error -O--CK 100 100 --- - 0 230 Perc_Write/Erase_Count -O--CK 001 001 --- - 99 70 99 232 Perc_Avail_Resrvd_Space PO--CK 100 100 004 - 100 233 Total_NAND_Writes_GiB -O--CK 100 100 --- - 7191 234 Perc_Write/Erase_Ct_BC -O--CK 100 100 --- - 7785 241 Total_Writes_GiB ----CK 253 253 --- - 7326 242 Total_Reads_GiB ----CK 253 253 --- - 16720 244 Thermal_Throttle -O--CK 000 100 --- - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 1957 Current Device Internal Status Data log 0x25 GPL R/O 1957 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 2764 --- Lifetime Power-On Resets 0x01 0x010 4 5433 --- Power-on Hours 0x01 0x018 6 15365744902 --- Logical Sectors Written 0x01 0x020 6 82337817 --- Number of Write Commands 0x01 0x028 6 35065035794 --- Logical Sectors Read 0x01 0x030 6 399675156087 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 7 Device-to-host register FISes sent due to a COMRESET