/dev/sda === START OF INFORMATION SECTION === Device Model: Micron C400 RealSSD 2.5" 7mm 256GB Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: 070H User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue May 15 03:01:32 2018 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1190) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 19) minutes. Conveyance self-test routine recommended polling time: ( 3) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 12 Power_Cycle_Count PO--CK 100 100 001 - 2734 175 Program_Fail_Count_Chip PO--CK 100 100 000 - 0 176 Erase_Fail_Count_Chip PO--CK 100 100 000 - 0 177 Wear_Leveling_Count PO--CK 100 100 010 - 21 178 Used_Rsvd_Blk_Cnt_Chip PO--CK 098 098 000 - 3 179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 000 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 001 001 000 - 8744 181 Program_Fail_Cnt_Total PO--CK 100 100 001 - 0 182 Erase_Fail_Count_Total PO--CK 100 100 001 - 132 187 Reported_Uncorrect PO--CK 100 100 001 - 0 195 Hardware_ECC_Recovered POSR-K 100 100 050 - 0 241 Total_LBAs_Written PO--CK 100 100 000 - 6846280560 242 Total_LBAs_Read PO--CK 100 100 000 - 6122542615 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 16383 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 255 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 3449 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0 GPL VS 2000 Device vendor specific log 0xa0 SL VS 208 Device vendor specific log 0xa1-0xbf GPL,SL VS 1 Device vendor specific log 0xc0 GPL VS 80 Device vendor specific log 0xc1-0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (16383 sectors) No Errors Logged SMART Extended Self-test Log size 3449 not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) SCT Support Level: 0 Device State: Active (0) Current Temperature: 39 Celsius Power Cycle Min/Max Temperature: 39/41 Celsius Lifetime Min/Max Temperature: 20/55 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: -5/75 Celsius Temperature History Size (Index): 478 (369) Index Estimated Time Temperature Celsius 370 2018-05-11 19:30 ? - ... ..(299 skipped). .. - 192 2018-05-13 21:30 ? - 193 2018-05-13 21:40 54 *********************************** 194 2018-05-13 21:50 55 ************************************ 195 2018-05-13 22:00 ? - ... ..(170 skipped). .. - 366 2018-05-15 02:30 ? - 367 2018-05-15 02:40 41 ********************** 368 2018-05-15 02:50 39 ******************** 369 2018-05-15 03:00 40 ********************* SCT Error Recovery Control: Read: 40 (4,0 seconds) Write: 40 (4,0 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 2734 --- Lifetime Power-On Resets 0x01 0x010 4 5611 --- Power-on Hours 0x01 0x018 6 6846280560 --- Logical Sectors Written 0x01 0x020 6 113343375 --- Number of Write Commands 0x01 0x028 6 6122542615 --- Logical Sectors Read 0x01 0x030 6 85980708 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 39 --- Current Temperature 0x05 0x010 1 38 --- Average Short Term Temperature 0x05 0x018 1 33 --- Average Long Term Temperature 0x05 0x020 1 55 --- Highest Temperature 0x05 0x028 1 17 --- Lowest Temperature 0x05 0x030 1 39 --- Highest Average Short Term Temperature 0x05 0x038 1 31 --- Lowest Average Short Term Temperature 0x05 0x040 1 35 --- Highest Average Long Term Temperature 0x05 0x048 1 32 --- Lowest Average Long Term Temperature 0x05 0x050 4 - --- Time in Over-Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x05 0x060 4 - --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 76 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 3 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x000a 4 3 Device-to-host register FISes sent due to a COMRESET