/dev/sda smartctl 7.3 2022-02-28 r5338 [x86_64-linux-5.17.6-300.fc36.x86_64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 840 EVO 250GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EXT0BB6Q User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon May 16 10:31:19 2022 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Unexpected SCT status 0x0001 (action_code=4, function_code=2) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4800) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 095 095 000 - 20694 12 Power_Cycle_Count -O--CK 099 099 000 - 668 177 Wear_Leveling_Count PO--C- 086 086 000 - 167 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 061 039 000 - 39 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 099 099 000 - 1 235 POR_Recovery_Count -O--C- 099 099 000 - 93 241 Total_LBAs_Written -O--CK 099 099 000 - 49634728519 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 16 Device vendor specific log 0xce GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 39 Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/124163 SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: ?/ ? Celsius Min/Max Temperature Limit: ?/ ? Celsius Temperature History Size (Index): 128 (9) Index Estimated Time Temperature Celsius 10 2022-05-15 13:20 ? - ... ..(117 skipped). .. - 0 2022-05-16 09:00 ? - 1 2022-05-16 09:10 24 ***** 2 2022-05-16 09:20 29 ********** 3 2022-05-16 09:30 32 ************* 4 2022-05-16 09:40 39 ******************** 5 2022-05-16 09:50 38 ******************* 6 2022-05-16 10:00 38 ******************* 7 2022-05-16 10:10 40 ********************* 8 2022-05-16 10:20 38 ******************* 9 2022-05-16 10:30 38 ******************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 5538 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 8 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/sdb smartctl 7.3 2022-02-28 r5338 [x86_64-linux-5.17.6-300.fc36.x86_64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Crucial/Micron Client SSDs Device Model: CT480BX500SSD1 Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: M6CR054 User Capacity: 480,103,981,056 bytes [480 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5319 ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon May 16 10:31:19 2022 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0 5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 120 12 Power_Cycle_Count -O--CK 100 100 000 - 148 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Ave_Block-Erase_Count -O--CK 100 100 000 - 3 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 2 180 Unused_Reserve_NAND_Blk PO--CK 100 100 000 - 42 183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0 184 Error_Correction_Count -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 069 054 000 - 31 (Min/Max 17/46) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_ECC_Cnt -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 202 Percent_Lifetime_Remain ----CK 100 100 001 - 0 206 Write_Error_Rate -OSR-- 100 100 000 - 0 210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0 246 Total_LBAs_Written -O--CK 100 100 000 - 930071653 247 Host_Program_Page_Count -O--CK 100 100 000 - 29064739 248 FTL_Program_Page_Count -O--CK 100 100 000 - 27921440 249 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 0 251 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 947273219 252 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 253 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 254 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 5 223 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 10 Device-to-host register FISes sent due to a COMRESET