Probe #4b9966832c of HP 829E (ProDesk 600 G3 DM)

Log: smartctl

/dev/sda smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.1.0-32-amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: A-DATA SSD Serial Number: -- Firmware Version: FW1848 User Capacity: 32,017,047,552 bytes [32.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available, deterministic Device is: Not in smartctl database 7.3/5319 ATA Version is: ATA8-ACS (minor revision not indicated) Local Time is: Sun Mar 30 18:18:11 2025 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Disabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x1d) SMART execute Offline immediate. No Auto Offline data collection support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x00) Error logging NOT supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 0) minutes. Extended self-test routine recommended polling time: ( 0) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate ------ 007 000 000 - 0 9 Power_On_Hours ------ 154 008 000 - 0 12 Power_Cycle_Count ------ 044 000 000 - 0 184 End-to-End_Error ------ 025 000 000 - 0 195 Hardware_ECC_Recovered ------ 050 000 000 - 0 196 Reallocated_Event_Count ------ 038 000 000 - 0 197 Current_Pending_Sector ------ 000 000 000 - 0 198 Offline_Uncorrectable ------ 040 068 000 - 64092 199 UDMA_CRC_Error_Count ------ 049 216 000 - 69062 200 Unknown_SSD_Attribute ------ 247 110 000 - 745 201 Unknown_SSD_Attribute ------ 167 246 000 - 687 202 Unknown_SSD_Attribute ------ 255 156 000 - 8 203 Run_Out_Cancel ------ 140 138 000 - 5 204 Soft_ECC_Correction ------ 000 000 000 - 0 205 Thermal_Asperity_Rate ------ 016 039 000 - 0 206 Unknown_SSD_Attribute ------ 021 002 000 - 0 207 Unknown_SSD_Attribute ------ 017 177 000 - 0 208 Unknown_SSD_Attribute ------ 013 019 000 - 0 209 Unknown_SSD_Attribute ------ 052 000 000 - 0 211 Unknown_Attribute ------ 000 000 000 - 0 212 Unknown_Attribute ------ 000 000 000 - 0 213 Unknown_Attribute ------ 000 000 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 51 Comprehensive SMART error log 0x03 GPL,SL R/O 77 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0xa0 GPL VS 4096 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 49 (77 sectors) No Errors Logged Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum. SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) [Reserved: 0x00 0x00 0x41 0x00] ID Size Value Description 0x8cd8 2 16489 Vendor specific


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